Testing leaking rays

ABSTRACT

Devices and methods of testing leaking rays are provided. In one aspect, a device includes a first rotary arm configured to rotate around a first rotary axis, a second rotary arm rotatably connected with the first rotary arm and configured to rotate around a second rotary axis, a probe mounted on a rotating end of the second rotary arm and configured to measure a numerical value of leaking rays at each position at which the probe stays, a mounting base rotatably connected with the second rotary arm and configured to mount a ray source component, a first driving unit configured to drive the first rotary arm to rotate around the first rotary axis, and a second driving unit configured to drive the second rotary arm to rotate around the second rotary axis, the first rotary axis being perpendicular to the second rotary axis.

CROSS REFERENCE TO RELATED APPLICATIONS

This application claims priority to Chinese Patent Application No.201710134957.9 entitled “Method and Device for Testing Leaking Rays”filed on Mar. 8, 2017, the entire content of which is incorporatedherein by reference.

TECHNICAL FIELD

The present disclosure relates to testing leaking rays.

BACKGROUND

Ray machines are widely applied to medical equipment such as computedtomography (CT) machines. The ray machine may include a ray sourcecomponent including a ray source and a beam limiter. Ray leaking test onthe ray source component is a necessary test for the ray machine.

According to requirements of relevant regulations for leaking ray test,a required measurement range is a surface of a sphere with a radiusbeing 1 meter and a center of the sphere being a focus of a ray sourceof the tested ray source component.

NEUSOFT MEDICAL SYSTEMS CO., LTD. (NMS), founded in 1998 with its worldheadquarters in China, is a leading supplier of medical equipment,medical IT solutions, and healthcare services. NMS supplies medicalequipment with a wide portfolio, including CT, Magnetic ResonanceImaging (MRI), digital X-ray machine, ultrasound, Positron EmissionTomography (PET), Linear Accelerator (LINAC), and biochemistry analyzer.Currently, NMS' products are exported to over 60 countries and regionsaround the globe, serving more than 5,000 renowned customers. NMS'slatest successful developments, such as 128 Multi-Slice CT ScannerSystem, Superconducting MRI, LINAC, and PET products, have led China tobecome a global high-end medical equipment producer. As an integratedsupplier with extensive experience in large medical equipment, NMS hasbeen committed to the study of avoiding secondary potential harm causedby excessive X-ray irradiation to the subject during the CT scanningprocess.

SUMMARY

The present disclosure provides methods and devices for testing leakingrays in a way that a leaking ray test can be implemented at costs as lowas possible.

One aspect of the present disclosure features a device for testingleaking rays, including: a first rotary arm configured to rotate arounda first rotary axis; a second rotary arm rotatably connected with thefirst rotary arm and configured to rotate around a second rotary axis; aprobe mounted on a rotating end of the second rotary arm and configuredto measure a numerical value of leaking rays at each position at whichthe probe stays; a mounting base rotatably connected with the secondrotary arm and configured to mount a ray source component; a firstdriving unit configured to drive the first rotary arm to rotate aroundthe first rotary axis; and a second driving unit configured to drive thesecond rotary arm to rotate around the second rotary axis. The firstrotary axis is perpendicular to the second rotary axis, the first rotaryaxis and the second rotary axis intersect with a body axis of the probeat a focus of a ray source in the ray source component, and the probe isat a predetermined distance from the focus.

The first driving unit can be configured to position the first rotaryarm at a first rotation position, and the second driving unit can beconfigured to position the second rotary arm at a second rotationposition. The second rotary arm can be provided with a counterweight forbalance at an end opposite to the rotating end on the second rotary arm.

In some implementations, the first rotary arm is of an L shape andincludes a transverse part and a vertical part. The transverse part ishinged to the mounting base, and the vertical part is hinged to thesecond rotary arm and perpendicular to the second rotary axis of thesecond rotary arm. The device can further include a column and a supportplate disposed at a top of the column. A central axis of the column cancoincide with the first rotary axis of the first rotary arm, a lower endof the column can be hinged to the transverse part of the first rotaryarm, and the mounting base can be detachably disposed on the supportplate.

In some implementations, the first rotary arm is of a bend-line shapeand includes a first arm extending from top to bottom and a second armbent from a lower end of the first arm toward the first rotary axis. Anupper end of the first arm can be hinged to the second rotary arm, andan end of the second arm close to the first rotary axis can be connectedwith a rotating shaft extending upward and downward, and an axis of therotating shaft extending upward and downward can be collinear with thefirst rotary axis.

In some examples, the device further includes a supporting beam at aside of the rotating shaft, and the supporting beam is provided with atleast two rotating plates spaced apart in an upward and downwarddirection, and the rotating plates are respectively connectedrotationally to an upper end and a lower end of the rotating shaft. Insome cases, the supporting beam is further provided with a connectingplate extending toward the first rotary axis, the connecting plate canbe provided with a supporting shaft disposed coaxially with the rotatingshaft and independent of the rotating shaft, and the mounting base canbe disposed at a top of the supporting shaft. In some cases, thesupporting beam is further provided with an accessory mounting platedisposed away from the first rotary axis and configured to mount anaccessory for testing leaking rays. In some cases, the device furtherincludes an electrical mounting plate at a side face of the supportingbeam far away from the rotating shaft, and the electrical mounting plateis configured to mount a power source and a control circuit board fortesting leaking rays.

Another aspect of the present disclosure features a method of testingleaking rays, including: providing a probe in an initial position at apredetermined distance from a focus of a ray source in a ray sourcecomponent to be tested for leaking rays; controlling the probe to moveon a longitudinal dimension and a latitudinal dimension by taking thefocus as a center of a sphere in a plurality of first motion periodssuch that positions at which the probe stays seamlessly form a firsthemispherical surface, and measuring a numerical value of leaking raysat each of the positions at which the probe stays in the firsthemispherical surface through the probe; flipping the ray sourcecomponent; and controlling the probe to move on the longitudinaldimension and the latitudinal dimension by taking the focus as thecenter of the sphere in a plurality of second motion periods such thatpositions at which the probe stays seamlessly form a secondhemispherical surface, and measuring a numerical value of leaking raysat each of the positions at which the probe stays in the secondhemispherical surface through the probe, the second hemisphericalsurface and the first hemispherical surface being combinable to be afull spherical surface. Adjacent positions of the probe in thelongitudinal dimension and the latitudinal dimension can be overlappedwith each other to form a seamless measurement area.

In some implementations, controlling the probe to move on thelongitudinal dimension and the latitudinal dimension by taking the focusas the center of the sphere in the plurality of the first motion periodsincludes: in each of the first motion periods, controlling the probe torotate by a first predetermined angle for a plurality of times on thelatitudinal dimension such that the positions at which the probe staysform a seamless latitudinal arc; and controlling the probe to rotate bya second predetermined angle on the longitudinal dimension.

The latitudinal arc can be a semicircular arc or a full circular arc.The focus can be taken as the center of the sphere, and a point on alargest-diameter circle of the spherical surface can be set to be aninitial position of the probe. The method can further include: in eachof the first motion periods, controlling the probe to reversely rotateto a starting point of the latitudinal arc when the latitudinal arc isformed. In some cases, controlling the probe to rotate by the secondpredetermined angle on the longitudinal dimension includes: controllingthe probe to rotate by the second predetermined angle in a selectedrotation direction on the longitudinal dimension.

In some implementations, controlling the probe to move on thelongitudinal dimension and the latitudinal dimension by taking the focusas the center of the sphere in the plurality of the second motionperiods includes: in each of the second motion periods, controlling theprobe to rotate by the first predetermined angle for a plurality oftimes on the latitudinal dimension such that the positions at which theprobe stays form a seamless latitudinal arc; and controlling the probeto rotate by the second predetermined angle in a selected rotationdirection on the longitudinal dimension.

The focus can be taken as the center of the sphere, and a point on thelargest-diameter circle of the spherical surface can be taken as theinitial position of the probe. The method can further include: in eachof the second motion periods, controlling the probe to reversely rotateto a starting point of the latitudinal arc when the latitudinal arc isformed.

The details of one or more examples of the subject matter described inthe present disclosure are set forth in the accompanying drawings anddescription below. Other features, aspects, and advantages of thesubject matter will become apparent from the description, the drawings,and the claims. Features of the present disclosure are illustrated byway of example and not limited in the following figures, in which likenumerals indicate like elements.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a schematic diagram illustrating probe motion in a method oftesting leaking rays according to an example of the present disclosure.

FIG. 2 is a schematic diagram illustrating a hemispherical surfaceformed by moving a probe according to FIG. 1.

FIG. 3A is a flowchart illustrating a method of testing leaking raysaccording to an example of the present disclosure.

FIG. 3B is a flowchart illustrating a method of testing leaking raysaccording to an example of the present disclosure.

FIG. 4 is a schematic diagram illustrating a structure of a device fortesting leaking rays according to an example of the present disclosure.

FIG. 5 is a schematic diagram illustrating a structure of a device fortesting leaking rays according to another example of the presentdisclosure.

DETAILED DESCRIPTION

In an example, 18 square probes complying with relevant regulations maybe arranged in a staggered manner into a semicircular probe group sothat a distance between each of the probes and a center of circle of thesemicircular probe group is 1 meter. In a manner that a diameter of thesemicircular probe group is taken as a rotation axis, a ray sourcecomponent may be installed on the rotation axis and a focus of a raysource of the ray source component is coincident with the center ofcircle of the probe group. The probe group is located at a side of ahorizontal direction of the ray source component. To perform a testduring a measuring process, the ray source component may be rotatedaround the rotation axis by 360 degrees while keeping the probe groupstationary. Since a bracket is installed under the ray source componentand the bracket can affect reception of rays leaked by the probe, onlythe measurement of an upper half is valid. Thus, only the test of ahemispherical surface can be completed. The ray source component may beflipped entirely by 180 degrees, for example, an arrangement of the raysource being below a beam limiter of the ray source component is changedinto an arrangement of the ray source being above the beam limiter. And,the ray source component may be rotated by 360 degrees around therotation axis to complete the test of the other hemispherical surface.Thus, the test of a full spherical surface is completed by twomeasurements.

In another example, the semi-circular probe group may be located justabove the ray source component. During a measuring process, with theprobe group being stationary, the ray source component may be rotatedaround the rotation axis by 180 degrees to realize a test of ahemispherical surface, may be flipped entirely by 180 degrees, forexample, the arrangement of the ray source being below the beam limiteris changed into the arrangement of the ray source being above the beamlimiter, and may be rotated around the rotation axis by 180 degrees tocomplete the test of the other hemispherical surface. Thus, the test ofthe full spherical surface can be completed by two times ofmeasurements.

In the above two examples, the device for testing leaking rays includes18 probes used for measurement and all of these probes are desired to bepaid calibrated once every three months. Also, the purchase cost and thesubsequent maintenance cost of the device are both high.

In an example of the present disclosure, to realize leaking ray test ata low cost as possible, a device for testing leaking rays can includeone probe complying with relevant regulations. There is a predetermineddistance from the probe to the focus of the ray source of the tested raysource component. The predetermined distance may be set to be 1 meteraccording to the relevant regulations. During a test, the tested raysource component is kept stationary, and the measurement of the fullspherical surface can be realized by controlling motion and stoppositions of the probe.

FIG. 1 is a schematic diagram illustrating probe motion in a method oftesting leaking rays according to an example of the present disclosure.FIG. 2 is a schematic diagram illustrating a hemispherical surfaceformed by a probe moving according to FIG. 1. Motion and a stop positionof a probe in an example of the present disclosure are described incombination with FIGS. 1 and 2.

In FIGS. 1 and 2, a probe may move along two motion dimensions. Two axespassing through a focus A of a ray source may be set as rotation axes.The two axes are perpendicular to each other, which may include avertical axis Y and a horizontal axis X. The probe may move in alatitudinal dimension that rotates around the vertical axis Y and in alongitudinal dimension that rotates around the horizontal axis Xrespectively.

In an example, the probe may rotate a plurality of circles in thelatitudinal dimension with 360 degrees for each circle, and rotate 90degrees in longitudinal dimension.

In each motion period, the probe may first rotate around the verticalaxis Y a plurality of times with a first predetermined angle for eachtime. When the probe rotates to 360 degrees, the motion of the probe inthe latitudinal dimension ends in the motion period. The probe rotatesby a second predetermined angle around the horizontal axis X to changethe position of the probe in the longitudinal dimension to start a nextmotion period.

When the probe rotates around the horizontal axis X to 90 degrees aplurality of times, all positions at which the probe stays exactly formsa hemispherical surface seamlessly, as shown in FIG. 2.

After the hemispherical surface is formed, the ray source component isentirely rotated by 180 degrees, the previous process is repeated toform the other hemispherical surface seamlessly. Thus, the twomeasurement results are combined into a full spherical surface.

In an example, the probe may rotate a plurality of circles in thelatitudinal dimension with 180 degrees for each circle, and rotate 180degrees in the longitudinal dimension.

In each motion period, the probe may first rotate around the verticalaxis Y for a plurality of times with a first predetermined angle foreach time. When the probe rotates around the vertical axis Y to 180degrees, the probe motion in the latitudinal dimension ends in themotion period. The probe rotates by a second predetermined angle aroundthe horizontal axis X to change the position of the probe in thelongitudinal dimension to start a next motion period.

When the probe rotates around the horizontal axis X a plurality of timesto 180 degrees, all positions at which the probe stays exactly forms ahemispherical surface seamlessly, as shown in FIG. 2.

After the hemispherical surface is formed, the ray source component isentirely rotated by 180 degrees, and the previous process is repeated toform the other hemispherical surface seamlessly. The two measurementresults are combined into a full spherical surface.

The rotation angle of the ray source component is not limited to 180degrees. In an example, the hemispherical surface formed after the raysource component is rotated and the hemispherical surface formed beforethe component is rotated can be combined to be a full spherical surface.

In FIGS. 1 and 2, each small circle represents a position at which theprobe stops. Each numeral mark in FIG. 1 indicates the number ofpositions at which the probe may stay in each circle in the latitudinaldirection. As shown in FIG. 1, the probe may stop at 1165 positions toform a hemispherical surface seamlessly. In an example, the number ofpositions at which the probe stays to form the hemispherical surfaceseamlessly is not limited to 1165 as long as the adjacent positions ofthe probe in the longitudinal dimension and the latitudinal dimensioncan be overlapped with each other to form a seamless measurement area.The greater the number of positions is, the longer time taken tocomplete the entire test of leaking rays is. However, in case that thenumber of the positions is small, the seamless measurement area cannotbe formed and the requirement of testing leaking rays cannot besatisfied. Thus, the testing efficiency can be improved by reducing thenumber of positions as much as possible in a case that the seamlessmeasurement area can be formed.

According to the above principle, a method of testing leaking rays isprovided in an example of the present disclosure, which includesprocedures in steps S110 to S140 in FIG. 3A.

At step S110, a probe is provided at a position with a predetermineddistance from a focus A of a ray source in a ray source component.

At step S120, the probe is controlled to perform motion in a pluralityof motion periods in a way that all positions at which the probe stayscan seamlessly form a first hemispherical surface after the motion inthe plurality of motion periods are performed, where the motion of theprobe in each motion period may include the motion in the longitudinaldimension and the motion in the latitudinal dimension with the focus Aof the ray source as the center of sphere.

At step S130, the ray source component is flipped by 180 degrees.

At step S140, the probe is controlled to form a second hemisphericalsurface according to procedures in step S120, where the firsthemispherical surface and the second hemispherical surface are combinedto be a full spherical surface.

When the probe stays at a particular position, the ray source emits raysand the probe measures a numerical value of leaking rays at theposition. When the positions at which the probe stays seamlessly formthe full spherical surface, the respective numerical values of leakingrays corresponding to all the positions within the coverage of the fullspherical surface can be obtained. Thus, a leaking ray test for the raysource component is completed.

In each motion period, a measurement area in the longitudinal dimensionand the latitudinal dimension is performed by performing motion on thetwo dimensions. After the motion is performed during a plurality ofmotion periods is completed, the respective measurement areas formed inall the motion periods can be spliced with each another to form ahemispherical surface, during which it is not desired to follow thesequence in the above principle shown in FIGS. 1 and 2.

When the probe is controlled to move according to the principle shown inFIGS. 1 and 2, the motion of the probe may be more regular in a way thatit can be avoided to form a seam, and the testing efficiency can befurther improved.

Further, a hemispherical surface described herein is not limited to afull hemispherical surface, for example, the formed hemisphericalsurface is larger than or smaller than the full hemispherical surface aslong as the first hemispherical surface and the second hemisphericalsurface can be combined to be a full spherical surface. When testconditions permit, the first hemispherical surface and the secondhemispherical surface may be equal parts.

As shown in FIG. 3B, in conjunction with the motion way in FIGS. 1 and2, and another motion way described above, a method of testing leakingrays is provided in an example of the present disclosure, whichspecifically include procedures as follows.

At step S11, a probe is provided at a position with a predetermineddistance from a focus A of a ray source in a ray source component, wherethe predetermined distance may be 1 meter according to relevantregulations, which may further be changed accordingly as required bytest.

At step S12, an initial position of the probe in a first motion circleis marked and a numerical value of leaking rays at the initial positionis measured. In an example, the position labelled with 84 on the largestcircle in FIG. 1 is taken as the initial position of the probe. Afterthe test starts, the probe is located in the initial position, the raysource emits rays and the probe measures the numerical value of leakingrays at the initial position.

At step S13, the probe is controlled to arrive at a second position. Inan example, the probe is controlled to rotate by a first predeterminedangle around a vertical axis Y in a counter-clockwise or clockwisedirection in the latitudinal dimension and stops rotating after reachingthe second position, where there is an overlapping region between thesecond position and the initial position such that the two adjacentpositions can form a seamless area in the latitudinal dimension.

At step S14, a numerical value of leaking rays at the second position ismeasured. In an example, in the second position, the ray source emitsrays, and the probe measures the numerical value of leaking rays at thesecond position.

At step S15, the probe is controlled to reach subsequent positions inthe latitudinal dimension according to the procedures in step S13 and tomeasure a numerical value of leaking rays at each of the subsequentpositions according to the procedures in step S14 when staying at thesubsequent position.

At step S16, the motion in the latitudinal dimension in a motion periodis stopped. If the positions at which the probe stays seamlessly form alatitudinal arc which satisfies the measurement requirement in thelatitudinal dimension in a first circle of motion period, the motion ofthe probe on the latitudinal dimension in the motion period ends. Thelatitudinal arc may be a full circular arc or a semicircular arc.

At step S17, the probe is controlled to reversely rotate to the initialposition of the first circle.

At step S18, the probe is controlled to reach an initial position of asecond circle. In an example, the probe is controlled to rotate aroundthe horizontal axis X in a clockwise or counter-clockwise direction by asecond predetermined angle in the longitudinal dimension from theinitial position of the first circle to reach the initial position ofthe probe in the second circle. The probe completes the motion on thelongitudinal dimension in one motion period.

At step S19, motion is performed in a plurality of motion periodsaccording to procedures in steps S12-S18 until the positions at whichthe probe stays can seamlessly form a first hemispherical surface, andthe measurement for numerical values of leaking rays at all thepositions within the first hemispherical surface is completed.

At step S20, the ray source component is entirely rotated by 180 degreesand the procedures in steps S12-S19 are repeatedly performed to completethe measurement for numerical values of leaking rays at all thepositions on a second hemispherical surface. The first hemisphericalsurface and the second hemispherical surface can be combined to be afull spherical surface, and the two measurement results of the first andsecond hemispherical surface can be combined to be measurement resultsof the full spherical surface.

At step S12, the initial position of the probe may be a point on thelargest-diameter longitudinal arc of the first hemispherical surface.The probe moves toward the top of the sphere on the longitudinaldimension from the initial position of the hemispherical surface,thereby fast and effectively forming a hemispherical surface andimproving controllability of the probe motion.

Another position may be selected as the initial position of the probe aslong as it is any point on the desired spherical surface. The probemoves on the latitudinal dimension from the initial position to form alatitudinal arc. A full spherical surface is formed by cooperating withmotion on the longitudinal dimension.

At step S13, when the probe completes a full circle of motion on thelatitudinal dimension by performing rotation 84 times, the firstpredetermined angle by which the probe rotates each time may be 4.286degrees. Thus, the test efficiency can be ensured when seamless area isperformed.

In some cases, the first predetermined angle is related to a measurementrange of the probe. When the measurement range of the probe is expanded,the first predetermined angle may be increased. Accordingly, therotation times by which the probe can complete a full circle ofmeasurement on the latitudinal dimension can be decreased, therebyfurther improving the test efficiency. Further, when the measurementrange of the probe is narrowed, the first predetermined angle can bereduced accordingly, and the rotation times of the probe may beincreased, thereby reducing the test efficiency.

At step S15, when the probe is controlled to reach each position on thelatitudinal dimension according to procedures in step S13, the selectedfirst predetermined angle may be same or different from that in step S13as long as the adjacent positions of all the positions obtained on thelatitudinal dimension can form the seamless spherical surface. The firstpredetermined angle may be a fixed value or a variable value, which maybe selected according to the test requirements.

At step S16, the formed latitudinal arc in a motion period may be a fullcircular arc. In this case, the probe rotates by 360 degrees on thelatitudinal dimension, for example, a full circle. Subsequently, theprobe rotates a plurality of times to 90 degrees on the longitudinaldimension to form a hemispherical surface. When the formed latitudinalarc on a motion period is a semicircular arc, the probe rotates by 180degrees in the latitudinal dimension, for example, half of a circle.Then, the probe rotates to 180 degrees on the longitudinal dimension toform a hemispherical surface.

At step S17, in each motion period, the probe may be controlled toreversely rotate to the initial position of the latitudinal arccorresponding to the motion period after the probe completes the motionon the latitudinal dimension. Since the probe may be connected withelectrical lines, it may cause that the electrical lines are intertwinedto affect normal testing when the probe continues to rotate at theposition at which the motion ends on the latitudinal dimension. However,when the probe returns to the initial position after completing themotion in the latitudinal dimension each time, the above problem can beeffectively avoided and the control accuracy for the motion of the probecan be improved.

In an example, the second predetermined angle may be equal to the firstpredetermined angle. In another example, the second predetermined angleis set according to the corresponding first predetermined angle as longas adjacent positions on the longitudinal dimension can be overlappedwith each other to achieve the seamless area on the longitudinaldimension. Further, on the longitudinal dimension, the secondpredetermined angle may be a fixed value or a variable value.

In an example, the first predetermined angle and the secondpredetermined angle are smaller than a predetermined value that mayrange from 4 to 6 degrees. In another example, the first predeterminedangle and the second predetermined angle are set according to themeasurement range of the probe to avoid a seam between adjacentpositions due to a large rotation angle of the probe at each time.

At steps S11-S20 above, the circle may be used to define differentlatitudinal arcs, e.g., the first circle and the second circle, theconcept of circles can be used to indicate that the probe startscircular motion on the latitudinal dimension, rather than that the probemoves a full circle on the latitudinal dimension. A specific rotationangle may be set according to requirements, e.g., the formed latitudinalarc is a full circular arc, a semicircular arc, or a quarterly circulararc, etc.

When the motion on the longitudinal dimension is performed and therotation direction is selected, the rotation direction of the probe maynot be changed. For example, the rotation direction of the probe on thelongitudinal dimension may be fixed. After the rotation direction on thelongitudinal dimension is fixed, the probe may perform coverage of thehemispherical surface circle by circle. Thus, repeated measurement orblind angle for measurement can be avoided, and measurement reliabilityand the measurement efficiency can be improved.

Based on the above, a device for testing leaking rays is providedaccording to an example of the present disclosure. The device fortesting leaking rays is disposed according to the above method oftesting leaking rays, and configured to perform the above method oftesting leaking rays.

FIG. 4 is a schematic diagram illustrating a structure of a device fortesting leaking rays according to an example of the present disclosure.FIG. 5 is a schematic diagram illustrating a structure of a device fortesting leaking rays according to another example of the presentdisclosure. As shown in FIGS. 4 and 5, the device for testing leakingrays includes a first rotary arm 2, a second rotary arm 3, a firstdriving unit 5, a second driving unit 6, a probe 1, and a mounting base4 for mounting a ray source component. The first driving unit 5 may beconfigured to drive the first rotary arm 2 to rotate around a firstrotary axis 17. The second driving unit 6 may be configured to drive thesecond rotary arm 3 to rotate around a second rotary axis 18. An end ofthe first rotary arm 2 is rotatably connected to the mounting base 4 andthe other end is rotatably connected to an end of the second rotary arm3. The other end of the second rotary arm 3 may be a rotating endrotating relative to the second rotary axis 18. The probe 1 may bemounted at the rotating end of the second rotary arm 3 to measure anumerical value of leaking rays at each position at which the probe 1stays.

The first rotary axis 17 of the first rotary arm 2 is perpendicular tothe second rotary axis 18 of the second rotary arm 3. The first rotaryaxis 17 and the second rotary axis 18 intersect with a body axis of theprobe 1 at a focus A of a ray source in the ray source component. Theprobe 1 may have a predetermined distance from the focus A. When thefirst rotary arm 2 and the second rotary arm 3 drive the probe 1 torotate, rotation points of the probe 1 are distributed on a sphericalsurface with a center of sphere being the focus A and the radius beingthe predetermined distance. Moreover, since the first rotary axis 17 ofthe first rotary arm 2 is perpendicular to the second rotary axis 18 ofthe second rotary arm 3, the first rotary arm 2 and the second rotaryarm 3 can rotate to drive the probe 1 to move in a latitudinal dimensionand a longitudinal dimension, respectively. If the rotation around thefirst rotary axis 17 of the first rotary arm 2 is taken as a motion onthe latitudinal dimension, the rotation around the second rotary axis 18of the second rotary arm 3 may be taken as a motion on the longitudinaldimension. Based on cooperation of the first rotary arm 2 and the secondrotary arm 3, the probe 1 may be driven to move in the longitudinaldimension and the latitudinal dimension, respectively, so that positionswhere the probe 1 stays may envelope into a full spherical surface.

The probe 1 may be provided at an outermost end that is on the secondrotary arm 3 and far away from the focus A. The rotary radius of thesecond rotary arm 3 may be equal to the predetermined distance. Themounting position of the probe 1 is adjusted on the second rotary arm 3according to requirements as long as the second rotary arm 3 can drivethe probe 1 to perform rotation based on the radius of the predetermineddistance. However, the value of the rotary radius of the second rotaryarm 3 is not limited to be equal to the predetermined distance.

The rotary radius of the first rotary arm 2 may be set as desired. In acase that there is no interference for the rotary motion, the rotaryradius of the first rotary arm 2 is as small as possible to reduce therotational inertia of the first rotary arm 2 in the rotary process,reduce the load of the first driving unit 5 and improve the stablereliability of rotation.

In an example, the rotation of the first rotary arm 2 may be controlledby the first driving unit 5, and the rotation of the second rotary arm 3may be controlled by the second driving unit 6. When the probe 1 isdriven by the rotation of the first rotary arm 2 to be at a particularposition of the latitudinal dimension, the probe 1 may be controlled tostay at the position and the ray source in the ray source component maybe controlled to perform emission, so that the probe 1 can measure anumerical value of leaking rays at the position. When the probe 1 isdriven by the rotation of the second rotary arm 3 to be at a particularposition of the longitudinal dimension, the probe 1 may be controlled tostay at the position and measure a numerical value of leaking rays atthe position. Thus, when the positions at which the probe 1 stays form afull spherical surface seamlessly, the leaking ray test for the raysource component is completed.

The predetermined distance and the specific test method may be similarwith that in the method of testing leaking rays in examples of thepresent disclosure, which is not repeatedly described herein.

In some examples, the latitudinal arcs in different methods of testingleaking rays may be different in each motion period. In some examples,the latitudinal arcs may be a full circular arc or a semicircular arc.

In an example, as shown in FIG. 4, the first rotary arm 2 may be ofL-shape and have a transverse part hinged to the mounting base 4 and avertical part hinged to the second rotary arm 3. The vertical part ofthe first rotary arm 2 may be perpendicular to the second rotary axis 18of the second rotary arm 3, and the first rotary axis 17 of the firstrotary arm 2 is in a direction parallel to the vertical part.

The device for testing leaking rays is further provided with a column 9and a support plate 10. The central axis of the column 9 coincides withthe first rotary axis 17 of the first rotary arm 2. The lower end of thecolumn 9 is hinged to the transverse part of the first rotary arm 2. Thecolumn 9 may be taken as the first rotary axis 17 of the first rotaryarm 2. The support plate 10 is provided at the upper end of the column9. The mounting base 4 is detachably provided on the support plate 10.According to the structure, rotatable connection of the first rotary arm2 and the mounting base 4 can be implemented. Further, in a measuringprocess, the support plate 10 on the column 9, the mounting base 4mounted on the support plate 10 and the ray source component can allremain stationary. The motion of the probe relative to the ray sourcecomponent on the latitudinal dimension can be achieved by driving thefirst rotary arm 2 to rotate relative to the column 9 through the firstdriving unit 5.

In the example, the rotary axis at which the column 9 is located maycorrespond to the vertical axis Y in the testing method above, and thecolumn 9 may extend from top to bottom. When rotating, the first rotaryarm 2 may drive the probe 1 to move on the latitudinal dimension.

The mounting base 4 and the support plate 10 are detachably connectedwith each other. It can be ensured that the focus A of the ray source inthe ray source component mounted on the mounting base 4 is in thecentral axis of the column 9 by controlling the mounting position of themounting base 4 on the support plate 10, thereby improving mountingconvenience and use convenience.

For different ray source components, the mounting bases 4 may havedifferent shapes or structures. Further, for two respective states forthe same ray source component before and after being entirely rotated by180 degrees, the mounting base 4 may have two different shapes orstructures. In an example, when the ray source is below the beamlimiter, the mounting base 4 may be a rectangular flat plate structurewith a specific thickness and a circular through hole in the centralpart as shown in FIG. 4. The tested ray source component is fixedlymounted on the mounting base 4, and the relative positions of themounting base 4 and the tested ray source component are fixed.

Since the column 9 supports the bottom of the mounting base 4, the probe1 can perform measurement on a measuring range covered by ahemispherical surface when the relative positions of the ray source andthe beam limiter in the ray source component are not changed. When themeasurement of the hemispherical surface is completed, the ray sourcecomponent may be entirely rotated by 180 degrees, and the rotated raysource component can be mounted by replacing the mounting base 4. In anexample, the mounting of the ray source component before and after beingrotated can be implemented by replacing the mounting base 4, so as tobetter meet measurement requirements and improve measurement efficiency.Further, for ray source components with different structures, themounting bases 4 with different structures can be selected, therebyimproving universality.

As shown in FIG. 4, in an example, the first rotary arm 2 is hinged tothe column 9 through the central portion of the transverse part of thefirst rotary arm 2. The rotating torque induced by the second rotary arm3 hinged to the vertical part of the first rotary arm 2 can be balanced,thereby improving the motion stability of the first rotary arm 2.

Further, the support plate 10 may be configured to mount accessoriesused for testing leaking rays, such as a high-voltage cabin, a powersource and a control circuit board. The mounted accessories may betogether near the column 9 without interference with the rotation of thefirst rotary arm 2 around the column 9. The support plate 10 may be arectangular flat plate structure with a specific thickness.

The first rotary axis 17 may correspond to the vertical axis Y in FIG.1, and the second rotary axis 18 may correspond to the horizontal axis Xin FIG. 1. The first rotary axis 17 is the rotation axis of the firstrotary arm 2, and the second rotary axis 18 is the rotation axis of thesecond rotary arm 3, and a third axis 19 is the body axis of the probe1. In an operation process of the device, the first rotary axis 17, thesecond rotary axis 18 and the third axis 19 intersect at a point nomatter regardless whether the probe 1 is in motion or stationary. Thepoint coincides with the focus A of the ray source of the tested raysource component. By replacing different mounting bases 4 of the raysource component, it can be ensured that the focuses A of thefixedly-mounted ray source components always coincide with the aboveintersecting point regardless which type of ray source component is usedand whether the ray source component have the structural that the raysource is below or above the beam limiter.

The device for testing leaking rays may further include a supportingbase 8 configured to support another part of the device for testingleaking rays. The supporting base 8 may contact with the ground andinclude a caster and a supporting structure in a way that it can bereplaced between the caster and the supporting structure. When thesupport is given by the caster, the supporting base 8 may set the wholedevice for testing leaking rays to move. When the test is desired, thecaster is replaced by the supporting structure to contact with theground for support, so that the device for testing leaking rays remainsstationary to facilitate testing.

There are different structures for the supporting base 8. In an example,the body of the supporting base 8 may be a cruciform structure weldedwith square tubes. Four ends which are on the cruciform structure andfar away from the center of the cruciform structure are fixedlyconnected to four casters with the supporting structure, respectively.When wheels on the casters contact with the ground, the supportingstructure are separated from the ground, and the device for testingleaking rays can move freely on the ground. When the supportingstructure contacts with the ground, the casters are separated from theground, and the relative position of the device to the ground are fixed.

In an example, to achieve support, the column 9 may be a long round tubestructure with a square base welded to the bottom of the column 9. Thesquare base is fixedly connected to the central portion of the cruciformstructure of the supporting base 8. The long round tube structure may behinged to the middle portion of the first rotary arm 2 with a hingepoint above the square base. The hinge point may be provided close tothe square base with no interference in a way that centers of gravity ofthe first rotary arm 2 and the support plate 10 can be lowered. The axisof the long round tube structure coincides with the first rotary axis 17perpendicular to the ground, and passes through the center of thecruciform structure of the supporting base 8 to improve the rotary andsupporting stability.

To facilitate the motion and stop of the probe 1, the first rotary arm 2may be positioned at any rotation position of the first driving unit 5,and the first driving unit 5 may continue to drive the probe 1 to rotateto a next measurement position after the probe 1 completes measurementat the position. Further, the second rotary arm 3 may be positioned at arotation position of the second driving unit 6, and the second drivingunit 6 may continue to drive the probe 1 to rotate to a next measurementposition after the probe 1 completes measurement at the position.

The first driving unit 5 may be located at a side of the first rotaryaxis 17, as shown in FIG. 4. The first driving unit 5 may not occupy amounting space in the vertical direction so that the mounting height ofthe support plate 10 can be lowed as much as possible, thereby loweringthe center of gravity of the whole testing device.

By being driven by the first driving unit 5, the first rotary arm 2 canrotate freely at any angle relative to the column 9 around the firstrotary axis 17. The first driving unit 5 may adopt any device orstructure combination capable of driving rotation motion. In an example,the first driving unit 5 may be a combination structure of a step motorand a speed reducer. The step motor and the speed reducer are fixedlyconnected. The body of the speed reducer is fixedly connected to asquare flange welded on the column 9, and the relative positions of thebody of the step motor and the square flange welded on the column 9 arefixed. The rotatable part of the speed reducer (e.g., a rotating shaftof the speed reducer) is fixedly connected to the transverse part of thefirst rotary arm 2, and the relative positions of the rotatable part ofthe speed reducer and the transverse part of the first rotary arm 2 arefixed. With the connection position, the first rotary arm 2 can be freewhen rotating around the first rotary axis 17 without any interference.

The second driving unit 6 may be located at a side which is on thesecond rotary arm 3 and faces the focus A. The rotational inertia in therotary process of the first rotary arm 2 can be lowered, the load of thefirst driving unit 5 can be reduced, and the stable reliability ofrotation can be improved.

Driven by the second driving unit 6, the second rotary arm 3 can rotatefreely relative to the first rotary arm 2 around the second rotary axis18. The second driving unit 6 may adapt a device or structurecombination capable of driving rotation motion. In an example, thesecond driving unit 6 may be a rotational electric cylinder. A body ofthe rotational electric cylinder is fixedly mounted at the top of thevertical part of the first rotary arm 2. The rotatable part of therotational electric cylinder (e.g., a rotating shaft of the rotationalelectric cylinder) is fixedly connected to the second rotary arm 3. Withthe connection position, a distance between the probe 1 and the focus Amay be a predetermined distance.

The second rotary arm 3 and the probe 1 are fixedly connected to eachother. The probe 1 may be a round structure with a handle and include around part and a mounting handle. The round part may be an oblatecylinder structure with a particular thickness. The mounting handle maybe a long cylinder structure, and the probe 1 may be connected to thesecond rotary arm 3 through the mounting handle. The second rotary arm 3may be a bend-line-shaped slender rod and an end of the second rotaryarm 3 is fixedly connected to the mounting handle of the probe 1 to formthe rotating end, and the other end is fixedly connected to acounterweight 7 for balances. The counterweight 7 may include acounterweight plate.

The device for testing leaking rays as shown in FIG. 4 may implementleaking ray test based on the following procedures.

When a position labelled to be 84 in the largest circle in FIG. 1 istaken as an initial position of a first circle of motion of the probe 1,the position of the first rotary arm 2 is set as a zero position, andthe second rotary arm 3 is in a horizontal state. After the test starts,the probe 1 is in the initial position, the ray source is controlled toemit rays, and the probe 1 measures a numerical value of leaking rays atthe initial position. The second rotary arm 3 remains stationary, thefirst rotary arm 2 rotates 4.286° counter-clockwise around the firstrotary axis 17 and stops rotating when the probe 1 reaches a secondposition. The ray source is controlled to emit rays, and the probe 1measures a numerical value of leaking rays at the second position. Thefirst rotary arm 2 continues to rotate 4.286°, and stops rotating afterthe probe 1 reaches a third position. The ray source is controlled toemit rays, and the probe 1 measures a numerical value of leaking rays atthe third position. The first rotary arm 2 rotates 83 timescounter-clockwise in sequence to complement the first circle ofmeasurement of 84 positions. The first rotary arm 2 reversely rotatesback to the zero position. Before a second circle of measurement starts,e.g., before a next motion period starts, the second rotary arm 3 firstrotates 4.286° around the second rotary axis 18 clockwise from thehorizontal position in the first circle of measurement and stops. Theprobe 1 is located in the initial position of the second circle ofmeasurement, the ray source is controlled to emit rays, and the probe 1measures a numerical value of leaking rays at the initial position ofthe second circle. When the second rotary arm 3 remains stationary, thefirst rotary arm 2 rotates 4.286° around the first rotary axis 17 andstops rotating when the probe 1 reaches a second position of the secondcircle. The ray source is controlled to emit rays, and the probe 1measures a numerical value of leaking rays at the second position of thesecond circle. The first rotary arm 2 continues to rotate 4.286° andstops rotating when the probe 1 reaches a third position of the secondcircle. The ray source is controlled to emit rays, and the probe 1measures a numerical value of leaking rays at the third position of thesecond circle. The second circle of measurement for 84 positions can becompleted when the first rotary arm 2 rotates 83 times in sequence. Thefirst rotary arm 2 reversely rotates back to the zero position. Beforeeach subsequent circle of measurement starts, the second rotary arm 3firstly continues to rotate 4.286° around the second rotary axis 18 onthe basis of the previous position and stops as the initial position ofthis circle for the probe 1. The first rotary arm 2 performs rotationmeasurement by an angle calculated based on the number of the labelledpositions of each circle in FIG. 1. When the second rotary arm 3 rotatesthe 21th time, the probe 1 is located at the top of the hemisphere whichis the last position of the hemispherical surface measurement, and thehemispherical surface measurement is completed when the measurement atthis position is finished. After the ray source component is entirelyrotated by 180° and fixedly mounted by using the corresponding mountingbase 4, the previous testing process is repeated to complete themeasurement of the other hemispherical surface. The two measurementresults of the hemispherical surfaces are combined to be measurementresults of a full spherical surface.

In an example, as shown in FIG. 5, the first rotary arm 2 may bebend-line-shaped which includes a first arm 21 and a second arm 22connected with each other. The first arm 21 may extend from top tobottom. The second arm 22 may be bent from the lower end of the firstarm toward the first rotary axis 17. An upper end of the first arm 21 ishinged to the second rotary arm 3. A left end of the second arm 22 isconnected to a rotating shaft 23 extending upward and downward. An axisof the rotating shaft 23 may be the first rotary axis 17 of the firstrotary arm 22. In an example, the rotating shaft 23 can rotate relativeto the mounting base 4 to implement the rotation of the first rotary arm2 relative to the mounting base 4. Further, the mounting base 4 islocated directly above the rotating shaft 23 to ensure that the axis ofthe rotating shaft 23 can pass through the focus A of the ray sourcemounted on the mounting base 4.

In an example, the device for testing leaking rays may further include asupporting beam 11 at a side of the rotating shaft 23. The supportingbeam 11 may include at least two rotating plates 12. The differentrotating plates 12 are distributed at a spacing in the upward anddownward direction. There are at least two rotating plates respectivelyconnected rotationally to an upper end and a lower end of the rotatingshaft to implement the rotation of the first rotary arm 2 relative tothe supporting beam 11. The supporting beam 11 implements rotationalsupport for the first rotary arm 2.

Further, the supporting beam 11 may further include a connecting plate13. The connecting plate 13 may extend toward the first rotary axis 17and may be provided with a supporting shaft 14 disposed coaxially withthe rotating shaft 23. The supporting shaft 14 is independent of therotating shaft 23 and configured to support the mounting base 4. Themounting base 4 may be disposed at the top of the supporting shaft 14.Support positioning for mounting base 4 is implemented throughcooperation of the supporting beam 11 and the connecting plate 13.Further, rotational support for the first rotary arm 2 is achieved bythe rotating plate 12, and the relative positions and the connectionrelation of the ray source component and the first rotary arm 2 areensured due to the position configuration of the supporting shaft 14 andthe rotating shaft 23.

When the supporting beam 11 is used for positioning support, anaccessory mounting plate 15 away from the first rotary axis 17 mayfurther be provided for mounting accessories desired for testing leakingrays, such as a high-voltage cabin. The accessories are concentrated ina direction away from the rotating shaft 23 without interference for therotation of the first rotary arm 2 around the rotating shaft 23 withinthe range of 180 degrees.

On the support beam 11, an electrical mounting plate 16 may further bedisposed at a side face far away from the rotating shaft 23. Theelectrical mounting plate 16 may be a rectangular thin plate and beconfigured to mount a power source and a control circuit board fortesting leaking rays, so as to facilitate centralized processing andcontrol for circuits and further reduce a burden of the accessorymounting plate 15. By setting a mounting space at the side face of thesupporting beam 11, it can be avoided to impact the rotational angle ofthe first rotary arm 2 on the latitudinal dimension due to excessivelycentralization of accessories.

Because many components are desired for testing leaking rays and theconnecting circuits are complex, it is difficult to put the componentsand connection circuits within a specific radius such that the devicefor testing leaking rays shown in FIG. 4 cannot be used to test leakingrays in some conditions.

Based on this, in the device for testing leaking rays shown in FIG. 5,the components and circuits desired for testing leaking rays areconcentrated together at a side away from the rotating shaft 23, and thespace at the side may be another 180-degree space opposite to the180-degree space range desired for the rotation of the first rotary arm2. In an example, in FIG. 5, the rotating space and the mounting spacecan be divided in the latitudinal dimension. In an example, the mountingspace is set at the side away from the rotating shaft 23 and the firstrotary arm 2, and another 180-degree space is set as the rotating spacefor the first rotary arm 2. The test in a hemispherical surface may becompleted through 180-degree rotation of the second rotary arm.

The device for testing leaking rays as shown in FIG. 5 may implement thetest based on the following procedures.

A position labelled to be 84 on the largest circle in FIG. 1 is taken asan initial position of a first circle of motion of the probe 1. Theposition of the first rotary arm 2 is set as a zero position, and thesecond rotary arm 3 is in a horizontal state. When the test starts, theprobe 1 is in the initial position of the first circle of motion, theray source is controlled to emit rays, and the probe 1 measures anumerical value of leaking rays at the initial position. The secondrotary arm 3 remains stationary, the first rotary arm 2 rotates 4.286°counter-clockwise around the first rotary axis 17 and stops rotatingwhen the probe 1 reaches a second position. The ray source is controlledto emit rays, and the probe 1 measures a numerical value of leaking raysat the second position. The first rotary arm 2 continues to rotate4.286° and stops rotating when the probe 1 reaches a third position. Theray source is controlled to emit rays, and the probe 1 measures anumerical value of leaking rays at the third position. The firstsemicircle of measurement of 42 positions can be completed when thefirst rotary arm 2 rotates 41 times counter-clockwise in sequence, andthe first rotary arm 2 reversely rotates back to the zero position.Before the second semicircle of measurement starts, e.g., before a nextmotion period starts, the second rotary arm 3 first rotates 4.286°around the second rotary axis 18 clockwise from the horizontal positionin the first semicircle of measurement and then stops in a way that theprobe 1 is located in the initial position of the second semicircle ofmeasurement. The ray source is controlled to emit rays, and the probe 1measures a numerical value of leaking rays at the initial position ofthe second semicircle. The second rotary arm 3 remains stationary, thefirst rotary arm 2 rotates 4.286° around the first rotary axis 17 andstops rotating when the probe 1 reaches a second position of the secondsemicircle. The ray source is controlled to emit rays, and the probe 1measures a numerical value of leaking rays at the second position of thesecond semicircle. The first rotary arm 2 continues to rotate 4.286° andstops rotating when the probe 1 reaches a third position of the secondsemicircle. The ray source is controlled to emit rays, and the probe 1measures a numerical value of leaking rays at the third position of thesecond semicircle. The second semicircle of measurement of 42 positionscan be completed when the first rotary arm 2 rotates 41 times insequence, and the first rotary arm 2 reversely rotates back to the zeroposition. Before each subsequent semicircle of measurement starts, thesecond rotary arm 3 firstly continues to rotate 4.286° around the secondrotary axis 18 on the basis of the previous position, and stops as theinitial position of the circle for the probe 1. Then, the first rotaryarm 2 rotates for measurement by an angle calculated based on the numberof the labelled positions of each circle in FIG. 1. When the secondrotary arm 3 rotates for the 21th time, the probe 1 is located at thetop of the hemisphere, e.g., the last position for quarterlyhemispherical surface measurement, and the quarterly hemisphericalsurface measurement is completed when the measurement at the positionends. The ray source component is entirely rotated by 180°, and fixedlymounted by using the corresponding mounting base 4. The previous testingprocess is repeated so as to complete the measurement of the otherhemispherical surface. The two measurement results are combined to be afull spherical surface.

The device for testing leaking rays shown in FIG. 5 may be differentfrom the device for testing leaking rays shown in FIG. 4 in relevantstructures such as the supporting beam 11 above, and another part of thedevice may be set similar with that on the device for testing leakingrays shown in FIG. 4.

In an example, the device for testing leaking rays shown in FIG. 5 mayinclude a supporting base 8. A structure of the supporting base 8 may besimilar with that in the device shown in FIG. 4. However, consideringthat the structure of the supporting beam 11 is different from thestructure of the column 9 in FIG. 4, the structures for implementingconnection of the supporting beam 11 and the supporting base 8 maydifferent.

In an example, the body of the supporting beam 11 may be a longrectangular tube structure with a square base welded on the bottom ofthe supporting beam 11. The square base is fixedly connected to thecentral portion of the cruciform structure of the supporting base 8. Tworectangular plates with a particular spacing and a particular thicknessare welded to the central region in a length direction of the longrectangular tube structure, which are as rotating plates 12. Twobearings are fixedly connected to two rotating plates 12, respectively.Axes of the two bearings respectively coincide with the first rotaryaxis 17 to implement connection with the rotating shaft 23 of the firstrotary arm 2.

When being driven by the first driving unit 5, the first rotary arm 2can freely rotate relative to the supporting beam 11 around the firstrotary axis 17 at any angle within the range of 180 degrees.

In some examples, the first driving unit 5 may be located at a side ofthe first rotary axis 17, and may be any device or structure combinationcapable of driving rotation motion. In an example, the first drivingunit 5 may be a structure including a servo motor and a speed reducer,and may implement rotational drive for the first rotary arm 2 inconjunction with a synchronous belt and two synchronous wheels.

When being combined, the servomotor and the speed reducer are fixedlyconnected to a side face of the long rectangular tube structure of thesupporting beam 11 in the vertical direction. The servomotor is locatedabove the speed reducer. An end of the speed reducer is fixedlyconnected with a synchronous wheel as a driving wheel. A synchronouswheel is further disposed as a driven wheel at the lower end of therotating shaft 23. Transmission between the two synchronous wheels isimplemented through the synchronous belt.

In the bend-line structure of the first rotary arm 2, two side faces onthe top of the first arm 21 and along the direction of the first rotaryaxis 17 are fixedly connected with two bearings, respectively. The twobearings together support a horizontal rotating shaft 24 parallel to theground and perpendicular to the first rotary axis 17. The axialdirection of the horizontal rotating shaft 24 may constitute the secondrotary axis 18. An end on the second rotary axis 18 and close to thefirst rotary axis 17 is fixedly connected with the second rotary arm 3.With the connecting position, a distance between the probe 1 and thefocus A may be a predetermined distance, which may be 1 meter.

Driven by the second driving unit 6, the second rotary arm 3 can freelyrotate relative to the first rotary arm 2 around the second rotary axis18.

In an example, the second driving unit 6 may be located at a side whichis on the second rotary arm 3 and toward the focus A. The second drivingunit 6 may be any device or structure combination capable of drivingrotational motion. In an example, the second driving unit 6 may be acombined structure of a servomotor and a speed reducer, and mayimplement rotational drive for the second rotary arm 3 in conjunctionwith a synchronous belt and two synchronous wheels.

The servomotor and the speed reducer may be fixedly connected to a sideface of the first arm 21 in the horizontal direction. The servomotor islocated at a side close to the first rotary axis 17, and the speedreducer is located at a side far away from the first rotary axis 17. Anend of the speed reducer is fixedly connected to one synchronous wheel.A side which is on the horizontal rotating shaft 24 and is far away fromthe first rotary axis 17 is fixedly connected to another synchronousbelt. The two synchronous wheels are connected through a synchronousbelt in a way that the second driving unit 6 transfers power to thesecond rotary axis 18.

Further, in the example, aspects such as the structure and theconnection way of the probe 1 may be set similar with that in the devicefor testing leaking rays shown in FIG. 4, which is not be redundantlydescribed herein.

It should be noted that upward and downward directions mentioned hereincan be directions perpendicular to a ground when a device for testingleaking rays normally operates. In an example, the direction pointing tothe ground is the downward direction, and the direction away from theground is the upward direction. The upward and downward directionsmentioned herein are same as a vertical direction. A horizontaldirection mentioned herein can be any direction in a plane perpendicularto the vertical direction.

The terms “first”, “second” and the like used herein are just used todifferentiate two or more same or similar structures or two or morecomponents with the same or similar structures and do not indicatespecific limitation to sequence.

The above are detailed descriptions of a method and device for testingleaking rays provided in the present disclosure. Specific examples areused herein to set forth the principles and the implementing methods ofthe present disclosure, and the descriptions of the above examples areonly meant to help understanding of the core idea of the presentdisclosure. It should be pointed out that those of ordinary skill in theart can make numerous improvements and modifications to the presentdisclosure without departing from the principle of the presentdisclosure and these improvements and modifications may also fall intothe scope of protection of claims of the present disclosure.

What is claimed is:
 1. A method of testing leaking rays, the methodcomprising: providing a probe in an initial position at a predetermineddistance from a focus of a ray source in a ray source component to betested for leaking rays; controlling the probe to move on a longitudinaldimension and a latitudinal dimension by taking the focus as a center ofa sphere in a plurality of first motion periods such that positions atwhich the probe stays seamlessly form a first hemispherical surface, andmeasuring a numerical value of leaking rays at each of the positions atwhich the probe stays in the first hemispherical surface through theprobe; flipping the ray source component; and controlling the probe tomove on the longitudinal dimension and the latitudinal dimension bytaking the focus as the center of the sphere in a plurality of secondmotion periods such that positions at which the probe stays seamlesslyform a second hemispherical surface, and measuring a numerical value ofleaking rays at each of the positions at which the probe stays in thesecond hemispherical surface through the probe, the second hemisphericalsurface and the first hemispherical surface being combinable to be afull spherical surface.
 2. The method of claim 1, wherein controllingthe probe to move on the longitudinal dimension and the latitudinaldimension by taking the focus as the center of the sphere in theplurality of the first motion periods comprises: in each of the firstmotion periods, controlling the probe to rotate by a first predeterminedangle for a plurality of times on the latitudinal dimension such thatthe positions at which the probe stays form a seamless latitudinal arc;and controlling the probe to rotate by a second predetermined angle onthe longitudinal dimension.
 3. The method of claim 2, wherein thelatitudinal arc is a semicircular arc or a full circular arc.
 4. Themethod of claim 2, wherein the focus is taken as the center of thesphere, and a point on a largest-diameter circle of the sphericalsurface is set to be an initial position of the probe.
 5. The method ofclaim 2, further comprising: in each of the first motion periods,controlling the probe to reversely rotate to a starting point of thelatitudinal arc when the latitudinal arc is formed.
 6. The method ofclaim 2, wherein controlling the probe to rotate by the secondpredetermined angle on the longitudinal dimension comprises: controllingthe probe to rotate by the second predetermined angle in a selectedrotation direction on the longitudinal dimension.
 7. The method of claim1, wherein controlling the probe to move on the longitudinal dimensionand the latitudinal dimension by taking the focus as the center of thesphere in the plurality of the second motion periods comprises: in eachof the second motion periods, controlling the probe to rotate by thefirst predetermined angle for a plurality of times on the latitudinaldimension such that the positions at which the probe stays form aseamless latitudinal arc; and controlling the probe to rotate by thesecond predetermined angle in a selected rotation direction on thelongitudinal dimension.
 8. The method of claim 7, wherein the focus istaken as the center of the sphere, and a point on the largest-diametercircle of the spherical surface is taken as the initial position of theprobe.
 9. The method of claim 7, further comprising: in each of thesecond motion periods, controlling the probe to reversely rotate to astarting point of the latitudinal arc when the latitudinal arc isformed.
 10. The method of claim 1, wherein adjacent positions of theprobe in the longitudinal dimension and the latitudinal dimension areoverlapped with each other to form a seamless measurement area.